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View Micro-Metrology optical measurement machines provide ultra-fast and highly accurate inspection solutions for wire bond applications. Equipped with advanced linear motor stages and Continuous Image Capture technology, View systems ensure precise measurement and analysis without sacrificing throughput. Ideal for semiconductor packaging and microelectronics manufacturing, View systems support: - Wire bond inspection and measurement - Bond pitch, loop height, and bond position analysis - Detection of bond defects and alignment issues - High-speed automated quality control for production environments With exceptional repeatability and micron-level accuracy, View helps manufacturers improve reliability, maximize yield, and maintain the highest quality standards in wire bonding processes. Category by High-Speed Measurement on VIEW Systems

View Micro-Metrology optical measurement machines are known for their incredible measurement speeds. With options for linear motor stages and our Continuous Image Capture technology, View is sure to be able to take your application to the next level. Category by High-Speed Measurement on VIEW Systems

VIEW Micro Metrology systems are ideal for advanced semiconductor and microelectronics inspection, including: - Through Glass Via measurement and inspection - Through Silicon Via metrology and analysis With superior accuracy, rapid data acquisition, and reliable automation, View enables manufacturers to optimize process control, improve yield, and accelerate production efficiency. Category by High-Speed Measurement on VIEW Systems

VIEW Micro Metrology System Introduction Contact: sales@anirestech.com Category by High-Speed Measurement on VIEW Systems

🧠 Smart Metrology for Advanced Semiconductor Applications VIEW Continuous Image Capture High-Speed, High-Accuracy Measurement for Fan-Out, Shower Head, and Probe Card Inspection Precision has a new standard. In the semiconductor industry, every micron matters — and every second counts. With VIEW’s Continuous Image Capture technology, you can inspect complex, high-density components like fan-out packages, probe cards, and shower heads at full speed without sacrificing measurement accuracy. 🔧 Purpose-Built for Semiconductor Challenges 🔹 Fan-Out WLP & Redistribution Layers (RDL) Measure ultra-fine features during motion Handle warpage and large formats with precision stitching Maintain sub-micron accuracy across wide fields of view 🔹 Shower Heads Measure hundreds of micro-nozzles quickly and consistently Perfect concentricity, pitch, and alignment analysis Non-contact inspection eliminates risk of surface damage 🔹 Probe Cards High-density pin array inspection with automatic alignment Fast measurement of probe tip height, pitch, coplanarity Reliable results, even with complex geometries ⚡ Speed Meets Accuracy ✅ Continuous Scanning – No need to stop for each image ✅ High-Speed Throughput – Ideal for volume production environments ✅ Sub-Micron Precision – Powered by VIEW’s advanced optics and software ✅ Robust Measurement Algorithms – Designed for high-contrast, fine-line features ✅ Seamless Integration – For QA labs, cleanrooms, and production lines 🔍 Metrology That Moves as Fast as You Do VIEW systems with Continuous Image Capture are trusted by leading fabs, OSATs, and semiconductor equipment manufacturers worldwide — enabling reliable, repeatable measurements for today's most demanding microelectronic components. 📞 Ready to Upgrade Your Semiconductor Inspection? Experience unmatched speed and precision with VIEW. Contact us today to schedule a live demo or learn more. 🌐 www.anirestech.com.my ✉️ sales@anirestech.com | ☎️ +60124983908 Category by High-Speed Measurement on VIEW Systems

VIEW Micro-Metrology provides high speed, high precision non-contact measuring systems for manufacturing process control. VIEW's high performance measuring systems and software are ideally suited for the small feature sizes and complex dimensioning schemes typical of micro-electronic and micro-fabricated parts. Category by High-Speed Measurement on VIEW Systems

VMS Measurement Basics High Accuracy and speed! Category by High-Speed Measurement on VIEW Systems

VIEW systems excel at integration into high-throughput production lines requiring fast measurement. In many cases, 100% inspection is attainable. With two highly versatile metrology software packages, VIEW systems can be programmed with highly customized edge detection and area processing functions that are perfectly suited for automated metrology, feature analysis, and defect detection. Unique tools such as Area Multi-Focus and Continuous Image Capture (strobing) along with powerful parametric and CAD-driven programming tools provide tremendous flexibility to enhance productivity. Category by High-Speed Measurement on VIEW Systems

VIEW Micro Metrology Systems on the fly measurement. No need to sacrifice accuracy with high speed! Category by High-Speed Measurement on VIEW Systems